Vytautas Magnus University Research Management System (VDU CRIS)
 
Use this url to cite publication: https://hdl.handle.net/20.500.12259/48687

Oxygen and carbon impurity effects on hydrogen storage properties of MgNi alloy films

Type of publication
Straipsnis Web of Science ir Scopus duomenų bazėje / Article in Web of Science and Scopus database (S1)
Author(s)
AuthorAffiliation
Pranevičius, Liudvikas 
Fizikos katedra / Department of Physics 
LT
Milčius, Darius orcid-logo
Lietuvos energetikos institutas
LT
LT
Lelis, Martynas 
Lietuvos energetikos institutas
LT
LT
Wirth, Emmanuel 
Fizikos katedra / Department of Physics 
LT
Bačianskas, Alius 
Fizikos katedra / Department of Physics 
LT
Title
Oxygen and carbon impurity effects on hydrogen storage properties of MgNi alloy films
[en]
Is part of
Przeglad elektrotechniczny = Electrical review
Date Issued
DateVolumeStart PageEnd Page
2010
7
78
80
Publisher
Warszawa : SIGMA-NOT
Is Referenced by
Science Citation Index Expanded (Web of Science) 
INSPEC 
Index Copernicus 
Scopus 
URI
URI
https://hdl.handle.net/20.500.12259/48687
Field of Science
OECD Classification
Sustainable Development Goals (SDG)
Prieinama ir švari energija / Affordable and clean energy (07)
Keywords (en)
Abstract (en)

1.5 mu m-thick MgNi films with ratio of Mg/Ni=2.5 have been sputtered on quartz substrates and hydrogenated at 0.8 MPa hydrogen pressure for 250 degrees C. It is shown that the decomposition of Mg(2)Ni and surface segregation of Mg occur during hydrogenation. For C-free MgNi films, the metallic Mg is bonded with oxygen and form non-permeable for hydrogen oxide layer. Carbon impurities modify surface hydrogen permeation properties, and complete transformation of Mg(2)Ni film into Mg(2)NiH(4) takes place during 30 min.

Type of document
type::text::journal::journal article::research article
Language
Anglų / English (en)
Coverage Spatial
Lenkija / Poland (PL)
Description

Straipsnis iš konferencijos „XXXV walny zjadz delegatów stowarzyszenia elektryków Polskich, Katowice, 25-26 czerwca 2010“

ISSN (of the container)
0033-2097
WOS
WOS:000279515700022
Other Identifier(s)
VDU02-000008763
JournalIFAIFAIF (min)AIF (max)CatAVYearQuartile
Przeglad Elektrotechniczny
0.242
1.462
1.462
1.462
1
0.166
2010
Q4
JournalIFAIFAIF (min)AIF (max)CatAVYearQuartile
Przeglad Elektrotechniczny
0.242
1.462
1.462
1.462
1
0.166
2010
Q4